Approximate reflection coefficients for a thin VTI layer
Journal article, Peer reviewed
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Original versionGeophysics. 2018, 83 (1), C1-C11. 10.1190/GEO2016-0638.1
We have developed an approximate method to derive simple expressions for the reflection coefficients of P- and SV-waves for a thin transversely isotropic layer with a vertical symmetry axis (VTI) embedded in a homogeneous VTI background. The layer thickness is assumed to be much smaller than the wavelengths of P- and SV-waves inside. The exact reflection and transmission coefficients are derived by the propagator matrix method. In the case of normal incidence, the exact reflection and transmission coefficients are expressed in terms of the impedances of vertically propagating P- and S-waves. For subcritical incidence, the approximate reflection coefficients are expressed in terms of the contrast in the VTI parameters between the layer and the background. Numerical examples are designed to analyze the reflection coefficients at normal and oblique incidence and investigate the influence of transverse isotropy on the reflection coefficients. Despite giving numerical errors, the approximate formulas are sufficiently simple to qualitatively analyze the variation of the reflection coefficients with the angle of incidence.