FIB/SEM Characterization of Paper Materials
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3D microscopy is of interest for structural characterization of paper materialsto study the use of cellulose nanofibrils as a paper additive. Focused ion beam(FIB) tomography is a promising microscopy technique for this application,combining scanning electron microscopy (SEM) with serial sectioning by ionbeam, potentially with nanoscale resolution. In this work, FIB tomography is demonstrated for paper samples, showing thatthe technique is applicable to this class of materials. Volume reconstructionswith voxel resolution down to 13x13x 15nm3 for volumes of up to approximately10x10x2 μm3 are obtained. The latter is limited by the acquisition time, andcan therefore be extended. A working protocol is developed, from sample preparation and image acquisitionto processing and volume reconstruction. The method is discussed in comparisonto established 3D methods for paper materials, and suggestions are madefor improving the resolution and increasing the volume.